Power Cycling & Power Device Reliability Lab
Lifetime and performance testing of power semiconductors and modules with a Siemens Simcenter Micred Power Tester 2400A.
Background
Starting with one T3Ster in 2017, our lab has grown to two T3Ster systems and a dedicated power cycling line for lifetime and performance testing of power modules — serving EV/HEV, inverter, renewable energy and industrial power electronics developers.
Equipment
- Siemens Simcenter Micred Power Tester 2400A (12 V × 4 channels)
- KeenusDesign test chamber with DUT fixtures, high-current and signal connections
- Four independent water-cooling loops with individual flow monitoring
- Parallel power distribution panel
- Julabo SC5000W chiller: 5 kW cooling, 25–80 °C, up to 33 L/min
Test Modes
Mode A — Power Cycling
Constant-current cycling with fixed or adaptive pulse timing. Control strategies: constant ΔTj, constant ΔTc or constant ΔP.
Mode B — Transient Thermal Resistance
JESD51-1 electrical test, Rth-jc per JESD51-14, RC-model structure function, non-destructive layer-by-layer package analysis and TSP calibration.
Mode C — Degradation Assessment
Real-time structure-function monitoring during cycling plus Von and Igate tracking. Limits on Max Von, Max Tj or Max ΔTj stop the test before destructive failure.
Power Tester 2400A — Heating Current Source
| Total max. current | 2400 A |
| Number of heating systems | 4 |
| Max. current per system | 600 A |
| Heating current resolution | 500 mA |
| Heating current accuracy | 0.1% of set value + 0.3% of range |
| Switch-on time | 50 ms |
| Switch-off time | 100 µs |
| Min. pulse-on duration | 0.5 s |
| Vce measurement range | 0 – 12 V |
| Vgs supply range | -10 – 20 V |
| Vgs accuracy | 0.5% of set value + 0.25% of range |
Simultaneous DUT Capacity by Module Von
| DUT Von | DUTs per heating system | Max. DUTs (all systems) |
|---|---|---|
| Von < 3 V | 4 | 16 |
| 3 V < Von < 4 V | 3 | 12 |
| 4 V < Von < 6 V | 2 | 8 |
| Von > 6 V | 1 | 4 |